Reconstruction of electrostatic force microscopy images
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1988089
Reference11 articles.
1. Kelvin probe force microscopy
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3. Potential imaging of operating light-emitting devices using Kelvin force microscopy
4. Kelvin probe force microscopy of semiconductor surface defects
5. Capacitive effects on quantitative dopant profiling with scanned electrostatic force microscopes
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