Potential imaging of operating light-emitting devices using Kelvin force microscopy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.123983
Reference7 articles.
1. Kelvin probe force microscopy
2. Silicon pn junction imaging and characterizations using sensitivity enhanced Kelvin probe force microscopy
3. Nanometer‐scale imaging of potential profiles in optically excited n‐i‐p‐i heterostructure using Kelvin probe force microscopy
4. Two-dimensional potential profile measurement of GaAs HEMT's by Kelvin probe force microscopy
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