Interpreting Kelvin probe force microscopy on semiconductors by Fourier analysis-Reference-Cited by-同舟云学术

Interpreting Kelvin probe force microscopy on semiconductors by Fourier analysis

Published:2021-01-21 Issue:3 Volume:129 Page:034301
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Xu Jie¹^ORCID,Chen Deyuan¹

Affiliation:

1. College of Electronic and Optical Engineering and College of Microelectronics, Nanjing University of Posts and Telecommunications, Nanjing 210023, China

Funder

National Natural Science Foundation of China

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/5.0024073

Reference39 articles.

1. A critique of the Kelvin method of measuring work functions

2. Kelvin probe force microscopy

3. Kelvin probe force microscopy and its application

4. Multiscale approach for simulations of Kelvin probe force microscopy with atomic resolution

5. Reconstruction of electrostatic force microscopy images

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