The effect of nanoscratching direction on the plastic deformation and surface morphology of InP crystals
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4833237
Reference31 articles.
1. Application of atomic-force-microscope direct patterning to selective positioning of InAs quantum dots on GaAs
2. Growth process of quantum dots precisely controlled by an AFM-assisted technique
3. Site selective growth of Ge quantum dots on AFM-patterned Si substrates
4. Atomic force nanolithography of InP for site control growth of InAs nanostructures
5. Directed self-assembly of quantum structures by nanomechanical stamping using probe tips
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1. Microscopic stress analysis of nanoscratch induced sub-surface defects in a single-crystal silicon wafer;Precision Engineering;2023-07
2. Investigation of the morphological and fractal behavior at nanoscale of patterning lines by scratching in an atomic force microscope;Microscopy Research and Technique;2021-11
3. Mechanical evaluation of bidirectional surface deformation in contact between nanometer-sized carbon particle and copper substrate: A molecular dynamics approach;Surfaces and Interfaces;2021-10
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5. Buckling tip-based nanoscratching with in situ direct measurement of shear dynamics;Applied Nanoscience;2018-10-27
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