Quantitative electron microprobe analysis of aluminum, copper, and gold thin films on silicon substrates

Author:

Yasuda Masaaki,Yamauchi Shunji,Kawata Hiroaki,Murata Kenji

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Cited by 10 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Determination of the Thickness of Thin Films Based on Scanning Electron Microscopy and Energy Dispersive X-Ray Analysis;Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques;2019-09

2. Transmission scanning electron microscopy: Defect observations and image simulations;Ultramicroscopy;2018-03

3. PIXE detection limit for aluminium thin film deposited on Si-based matrix;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2017-09

4. A comparative study of inelastic scattering models at energy levels ranging from 0.5 keV to 10 keV;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2017-03

5. On the Characterization of Ultra Thin Al Films Deposited onto SiC Substrate Using PIXE Technique;Advanced Materials Research;2011-08

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