Influence of the electron beam on electromigration measurements within a scanning electron microscope-Reference-Cited by-同舟云学术

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Influence of the electron beam on electromigration measurements within a scanning electron microscope

Published:2007-01-22 Issue:4 Volume:90 Page:043517
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Stahlmecke B.,Dumpich G.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.2432304

Reference19 articles.

1. DIRECT TRANSMISSION ELECTRON MICROSCOPE OBSERVATION OF ELECTROTRANSPORT IN ALUMINUM THIN FILMS

2. Electromigration in metals

3. Recent advances on electromigration in very-large-scale-integration of interconnects

4. An introduction to Cu electromigration

5. Electromigration in thin-film interconnection lines: models, methods and results

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1. Electromigration and the structure of metallic nanocontacts;Applied Physics Reviews;2017-09

2. Atomistic Breaking Processes via Electromigration in Platinum Nanocontacts;Journal of the Physical Society of Japan;2014-10-15

3. The Dynamics of Electromigration in Copper Nanocontacts;Applied Physics Express;2009-06-19

4. Embedding of a gold nanofin array in a polymer film to create transparent, flexible and anisotropic electrodes;Journal of Materials Chemistry;2009

5. Electrical Failure Analysis of Au Nanowires;IEEE Transactions on Nanotechnology;2008-11

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