Metal–semiconductor junctions on p‐type strained Si1−xGex layers
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.115720
Reference18 articles.
Cited by 26 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Introduction to Schottky-Barrier MOS Architectures: Concept, Challenges, Material Engineering and Device Integration;Nanoscale CMOS;2013-03-05
2. Effect of different chemical treatments of surface on the height of Al-p-SiGe and Au-n-SiGe barriers;Semiconductors;2010-05
3. Effects of Two-Step Deposition on Current Transport in Al-Ge-Au Sandwich Structures;Journal of Engineering and Applied Sciences;2010-04-01
4. Schottky Barrier Height Engineering on NiSiGe/SiGe Contacts;ECS Transactions;2008-10-03
5. Effect of the Ge content on the Schottky barrier height in structures based on Si1 − x Ge x solid solution;Technical Physics;2008-08
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