Electron channeling contrast imaging of anti-phase boundaries in coherently strained La0.7Sr0.3MnO3 thin films on (110)-oriented SrTiO3
Author:
Affiliation:
1. Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh, Pennsylvania 15213, USA
Funder
Air Force Office of Scientific Research (AFOSR)
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4927201
Reference37 articles.
1. Strain Tuning of Ferroelectric Thin Films
2. Strain relaxation in the epitaxy of La2/3Sr1/3MnO3grown by pulsed-laser deposition on SrTiO3(001)
3. Role of threading dislocation structure on the x‐ray diffraction peak widths in epitaxial GaN films
4. Electron diffraction based techniques in scanning electron microscopy of bulk materials
5. Theory and application of electron channelling contrast imaging under controlled diffraction conditions
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3. Reprint of: Electron channelling contrast imaging for III-nitride thin film structures;Materials Science in Semiconductor Processing;2016-11
4. Characterization of encapsulated quantum dots via electron channeling contrast imaging;Applied Physics Letters;2016-08-08
5. Combined Electron Channeling Contrast Imagining (ECCI) and Transmission Electron Microscopy (TEM) Studies of Coherent Domain Boundaries in Strained La 0.7 Sr 0.3 MnO 3 (LSM) Epitaxial Thin Films;Microscopy and Microanalysis;2016-07
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