Characterization of encapsulated quantum dots via electron channeling contrast imaging-Reference-Cited by-同舟云学术

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Characterization of encapsulated quantum dots via electron channeling contrast imaging

Published:2016-08-08 Issue:6 Volume:109 Page:062101
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Deitz Julia I.¹,Carnevale Santino D.²,De Graef Marc³^ORCID,McComb David W.¹,Grassman Tyler J.¹²

Affiliation:

1. Department of Materials Science and Engineering, The Ohio State University, Columbus, Ohio 43210, USA

2. Department of Electrical and Computer Engineering, The Ohio State University, Columbus, Ohio 43210, USA

3. Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh, Pennsylvania 15213, USA

Funder

The Ohio State University Institute for Materials Research

Air Force Research Laboratory (AFRL)

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/am-pdf/10.1063/1.4960643

Reference50 articles.

1. Near 1 V open circuit voltage InAs/GaAs quantum dot solar cells

2. Identification of candidate material systems for quantum dot solar cells including the effect of strain

3. Nanostructured Absorbers for Multiple Transition Solar Cells

4. Quasi-drift diffusion model for the quantum dot intermediate band solar cell

5. Quantum dots: lasers and amplifiers

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