Strain Tuning of Ferroelectric Thin Films

Author:

Schlom Darrell G.1,Chen Long-Qing1,Eom Chang-Beom2,Rabe Karin M3,Streiffer Stephen K4,Triscone Jean-Marc5

Affiliation:

1. Department of Materials Science and Engineering, Pennsylvania State University, University Park, Pennsylvania 16802-5005;

2. Department of Materials Science and Engineering, University of Wisconsin, Madison, Wisconsin 53706;

3. Department of Physics and Astronomy, Rutgers University, Piscataway, New Jersey 08854-8019;

4. Center for Nanoscale Materials, Argonne National Laboratory, Argonne, Illinois 60439;

5. DPMC, University of Geneva, 1211 Geneva 4, Switzerland;

Abstract

Predictions and measurements of the effect of biaxial strain on the properties of epitaxial ferroelectric thin films and superlattices are reviewed. Results for single-layer ferroelectric films of biaxially strained SrTiO3, BaTiO3, and PbTiO3 as well as PbTiO3/SrTiO3 and BaTiO3/SrTiO3 superlattices are described. Theoretical approaches, including first principles, thermodynamic analysis, and phase-field models, are applied to these biaxially strained materials, the assumptions and limitations of each technique are explained, and the predictions are compared. Measurements of the effect of biaxial strain on the paraelectric-to-ferroelectric transition temperature (TC) are shown, demonstrating the ability of percent-level strains to shift TC by hundreds of degrees in agreement with the predictions that predated such experiments. Along the way, important experimental techniques for characterizing the properties of strained ferroelectric thin films and superlattices, as well as appropriate substrates on which to grow them, are mentioned.

Publisher

Annual Reviews

Subject

General Materials Science

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