Oxygen tracer studies of ferroelectric fatigue in Pb(Zr,Ti)O3 thin films
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1516628
Reference13 articles.
1. Ferroelectric La‐Sr‐Co‐O/Pb‐Zr‐Ti‐O/La‐Sr‐Co‐O heterostructures on silicon via template growth
2. Control of structure and electrical properties of lead‐zirconium‐titanate‐based ferroelectric capacitors produced using a layer‐by‐layer ion beam sputter‐deposition technique
3. Preparation of Pb(Zr,Ti)O3thin films on electrodes including IrO2
4. Polarization fatigue in ferroelectric films: Basic experimental findings, phenomenological scenarios, and microscopic features
5. Mechanism of Fatigue in Ferroelectric Thin Films
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3. Interfacial dielectric layer as an origin of polarization fatigue in ferroelectric capacitors;Scientific Reports;2020-04-30
4. The Effect of Acceptor and Donor Doping on Oxygen Vacancy Concentrations in Lead Zirconate Titanate (PZT);Materials;2016-11-22
5. Effect of top electrode material on radiation-induced degradation of ferroelectric thin film structures;Journal of Applied Physics;2016-07-14
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