Author:
Nakamura Takashi,Nakao Yuichi,Kamisawa Akira,Takasu Hidemi
Subject
Physics and Astronomy (miscellaneous)
Cited by
308 articles.
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1. Investigations on structural, dielectric, and ferroelectric properties of Bi4-xNdxTi3O12 (x = 0.00, 0.85) ceramics;Interactions;2024-08-29
2. Role of semiconductor layer thickness in the electrical properties of BaTiO3-based MFIS-heterostructured devices;Journal of Materials Science: Materials in Electronics;2024-07
3. Understanding HZO Thickness Scaling in Si FeFETs: Low Operating Voltage, Fast Wake-Up, and Suppressed Charge Trapping;IEEE Transactions on Electron Devices;2024-06
4. The elasticity and piezoelectricity of AlN containing charged vacancies;International Journal of Optomechatronics;2024-04-16
5. Two-Dimensional Janus Nanostructures M2AB (M = Si, Ge, Sn, A/B = N, P, As) for Piezoelectric Power Generation;ACS Applied Nano Materials;2024-03-21