Stress-induced traps in multilayered structures-Reference-Cited by-同舟云学术

Stress-induced traps in multilayered structures

Published:2011-01 Issue:1 Volume:109 Page:013717
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Ciurea Magdalena Lidia,Lazanu Sorina,Stavarache Ionel,Lepadatu Ana-Maria,Iancu Vladimir,Mitroi Mihai Razvan,Nigmatullin Raoul Rashid,Baleanu Cristina Mihaela

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.3525582

Reference50 articles.

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2. Interface trap properties of thermally oxidized n-type 4H–SiC and 6H–SiC

3. Theoretical model of interface trap density using the spread of the differential capacitance characteristics in scanning capacitance microscopy measurements

4. Carrier loss channels for non-collected carrier in InAsxP1−x∕InP multiquantum well solar cells

5. Observation of minority-carrier traps in InGaN∕GaN multiple-quantum-well light-emitting diodes during deep-level transient spectroscopy measurements

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