A versatile atomic force microscope integrated with a scanning electron microscope
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Published:2017-05
Issue:5
Volume:88
Page:053704
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ISSN:0034-6748
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Container-title:Review of Scientific Instruments
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language:en
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Short-container-title:Review of Scientific Instruments
Author:
Kreith J.,
Strunz T.,
Fantner E. J.,
Fantner G. E.,
Cordill M. J.ORCID
Cited by
21 articles.
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