A novel AFM/STM/SEM system
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1144627
Reference6 articles.
1. Atomic Force Microscope
2. Tunneling through a controllable vacuum gap
3. Scanning tunneling microscopy—from birth to adolescence
4. A scanning tunneling microscope/scanning electron microscope system for the fabrication of nanostructures
5. Novel optical approach to atomic force microscopy
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