Characterization of CdS/CdTe thin‐film solar cells by admittance spectroscopy and deep‐level transient spectroscopy
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.333917
Reference31 articles.
1. Status of New Thin-Film Photovoltaic Technologies
2. Deep‐level transient spectroscopy: A new method to characterize traps in semiconductors
3. Admittance spectroscopy of impurity levels in Schottky barriers
4. Deep level impurities and current collection in CdS/CdTe thin‐film solar cells
5. Annealing of CdS/CdTe solar cells
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