Author:
Caron A.,Rabe U.,Reinstädtler M.,Turner J. A.,Arnold W.
Subject
Physics and Astronomy (miscellaneous)
Reference14 articles.
1. Atomic Force Microscope
2. V. Scherer, M. Reinstaedtler, and W. Arnold, inApplied Scanning Probe Methods, edited by H. Fuchs, B. Bhushan, and S. Hosaka (Springer, Berlin, 2003), pp. 76–115, and references therein.
3. B. Bhushan, inHandbook of Nanotechnology, edited by B. Bhushan (Springer, Berlin, 2004), pp. 497ff, and references therein.
4. Atomic-scale friction of a tungsten tip on a graphite surface
5. A lateral modulation technique for simultaneous friction and topography measurements with the atomic force microscope
Cited by
27 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献