High-sensitivity imaging with lateral resonance mode atomic force microscopy-Reference-Cited by-同舟云学术

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High-sensitivity imaging with lateral resonance mode atomic force microscopy

Published:2016 Issue:43 Volume:8 Page:18421-18427
ISSN:2040-3364
Container-title:Nanoscale
language:en
Short-container-title:Nanoscale

Author:

Ding Ren-Feng,Yang Chih-Wen,Huang Kuang-Yuh,Hwang Ing-Shouh

Funder

Academia Sinica

Ministry of Science and Technology, Taiwan

Publisher

Royal Society of Chemistry (RSC)

Subject

General Materials Science

Link

http://pubs.rsc.org/en/content/articlepdf/2016/NR/C6NR04151E

Reference22 articles.

1. Atomic Force Microscope

2. Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy

3. High Resolution Atomic Force Microscopic Imaging of theSi(111)−(7×7)Surface: Contribution of Short-Range Force to the Images

4. Dynamic atomic force microscopy methods

5. Advances in atomic force microscopy

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1. In-plane and out-of-plane interaction analysis of adsorbates on multilayer graphene and graphite by multifrequency atomic force microscopy;Carbon;2022-11

2. Extraction algorithm for longitudinal and transverse mechanical information of AFM;Nanotechnology and Precision Engineering;2022-06-01

3. Torsional and lateral eigenmode oscillations for atomic resolution imaging of HOPG in air under ambient conditions;Scientific Reports;2022-05-28

4. Integrated analysis of chain orientation induced anisotropy in nanoimprinted PVDF based copolymers;Polymer;2022-01

5. Dynamic friction energy dissipation and enhanced contrast in high frequency bimodal atomic force microscopy;Friction;2021-03-12

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