High Resolution Atomic Force Microscopic Imaging of theSi(111)−(7×7)Surface: Contribution of Short-Range Force to the Images-Reference-Cited by-同舟云学术

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High Resolution Atomic Force Microscopic Imaging of theSi(111)−(7×7)Surface: Contribution of Short-Range Force to the Images

Published:2002-12-10 Issue:26 Volume:89 Page:
ISSN:0031-9007
Container-title:Physical Review Letters
language:en
Short-container-title:Phys. Rev. Lett.

Author:

Eguchi Toyoaki,Hasegawa Y.

Publisher

American Physical Society (APS)

Subject

General Physics and Astronomy

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.89.266105/fulltext

Reference17 articles.

1. Atomic Force Microscope

2. Surface-tip interactions in noncontact atomic-force microscopy on reactive surfaces: Si(111)

3. Frequency modulation detection using high‐Qcantilevers for enhanced force microscope sensitivity

4. Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy

5. Light Scattering Properties in Ternary Germanate Glasses

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