A lateral modulation technique for simultaneous friction and topography measurements with the atomic force microscope
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1144630
Reference10 articles.
1. Atomic Force Microscope
2. Atomic force microscopy using optical interferometry
3. Simultaneous measurement of lateral and normal forces with an optical‐beam‐deflection atomic force microscope
4. From molecules to cells: imaging soft samples with the atomic force microscope
5. Combined scanning force and friction microscopy of mica
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