Atomic force microscopy using optical interferometry-Reference-Cited by-同舟云学术

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Atomic force microscopy using optical interferometry

Published:1988-03 Issue:2 Volume:6 Page:266-270
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

Erlandsson R.,McClelland G. M.,Mate C. M.,Chiang S.

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.575440

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