Development of near‐bamboo and bamboo microstructures in thin‐film strips
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.107661
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1. Linewidth dependence of electromigration in evaporated Al‐0.5%Cu
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3. Grain size dependence of electromigration‐induced failures in narrow interconnects
4. A model for the effect of line width and mechanical strength on electromigration failure of interconnects with “near-bamboo” grain structures
5. A two-dimensional computer simulation of capillarity-driven grain growth: Preliminary results
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