A model for the width dependence of electromigration lifetimes in aluminum thin‐film stripes
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.91385
Reference6 articles.
1. Dependence of Electromigration‐Induced Failure Time on Length and Width of Aluminum Thin‐Film Conductors
2. Linewidth dependence of electromigration in evaporated Al‐0.5%Cu
3. Electromigration in thin gold films on molybdenum surfaces
4. Electromigration in thin aluminum films on titanium nitride
5. The threshold current density and incubation time to electromigration in gold films
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