A systematic study on structural and dielectric properties of lead zirconate titanate/(Pb,La)(Zr(1−x)Ti(x))O3 thin films deposited by metallo-organic decomposition technology-Reference-Cited by-同舟云学术

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A systematic study on structural and dielectric properties of lead zirconate titanate/(Pb,La)(Zr(1−x)Ti(x))O3 thin films deposited by metallo-organic decomposition technology

Published:1996 Issue:8 Volume:79 Page:4283
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:J. Appl. Phys.

Author:

Zhu W.,Liu Z. Q.,Lu W.,Tse M. S.,Tan H. S.,Yao X.

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Reference50 articles.

1. Ferroelectric Memories

2. An experimental 512-bit nonvolatile memory with ferroelectric storage cell

3. Electrical characteristics of ferroelectric PZT thin films for DRAM applications

4. Films of 60/40 PZT by the mod process for memory applications

5. Fatigue of ferroelectric PbZrxTiyO3 capacitors with Ru and RuOx electrodes

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