Enlarged quantum well in a semiconductor superlattice studied by depth resolved grazing incidence x‐ray diffraction
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.360001
Reference17 articles.
1. X-ray diffraction of multilayers and superlattices
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3. Investigation of interfacial roughness of InxGa1−xAs epitaxial layers on GaAs and InP substrates by soft x‐ray reflectivity
4. Characterization of Ga1−xAlxAs/GaAs superlattices and thin single layers by X-ray diffraction
5. X‐ray interference in quantum‐well laser structures
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1. Depth-selective structural analysis of thin films using total-external-reflection x-ray diffraction;Journal of Physics: Condensed Matter;2010-11-15
2. Structural properties of CdS-doped glass nanocrystallites grown by pulsed laser deposition in high vacuum;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2001-01
3. Rotary target method to prepare thin films of CdS/SiO2 by pulsed laser deposition;Journal of Crystal Growth;2000-12
4. X-ray investigations of the molecular mobility within polymer surface gratings;Journal of Applied Physics;2000-06
5. Atomic Force Microscopy and Grazing Incidence Diffraction Investigation of the Gas-Solid Diazotation of Sulfanilic Acid;Molecular Crystals and Liquid Crystals Science and Technology. Section A. Molecular Crystals and Liquid Crystals;1997-02
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