Stress analysis and ferroelectric properties of Pb(Zr0.52Ti0.48)0.96Nb0.04O3 thin film grown on different thickness of BaPbO3 electrodes
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3518516
Reference42 articles.
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4. Switching properties of Pb(Nb, Zr, Ti)O3 capacitors using SrRuO3 electrodes
5. Polycrystalline La0.5Sr0.5CoO3/PbZr0.53Ti0.47O3/ La0.5Sr0.5CoO3ferroelectric capacitors on platinized silicon with no polarization fatigue
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1. Understanding the stress effect of TiN top electrode on ferroelectricity in Hf0.5Zr0.5O2 thin films;Journal of Applied Physics;2023-11-16
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3. Estimation of residual stresses in perovskite films for capacitor applications;Thin Solid Films;2018-02
4. Structural and electrical properties of pulsed laser deposited BaPbO3 conductive thin films and its effect on the ferroelectric properties of PbZr0.52Ti0.48O3 /BaPbO3 heterostructures;Ferroelectrics;2017-04-04
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