Apparatus for X‐Ray Diffraction Studies of Metals under Controlled Stress at Elevated Temperature-Reference-Cited by-同舟云学术

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Apparatus for X‐Ray Diffraction Studies of Metals under Controlled Stress at Elevated Temperature

Published:1954-10 Issue:10 Volume:25 Page:963-966
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Birks L. S.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1770929

Reference5 articles.

1. Une méthode d'étude au moyen des rayons X des changements de phases aux températures élevées

2. A High Temperature X‐Ray Diffraction Apparatus

3. Effect of Applied Stress on the Martensitic Transformation

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Literaturverzeichnis;Untersuchungen im System Al2O3-SiO2;1971

2. An Ultrahigh-Temperature, Single-Crystal Texture Camera Diffractometer;Advances in X-Ray Analysis;1965

3. An Ultrahigh-Temperature, Single-Crystal Texture Camera Diffractometer*;Advances in X-ray Analysis;1964

4. Alignment Device and Thermal-Control System for High-Temperature X-Ray Diffractometry;Advances in X-Ray Analysis;1962

5. High-Temperature Furnaces for X-Ray Diffractometers;Advances in X-Ray Analysis;1962

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