An Ultrahigh-Temperature, Single-Crystal Texture Camera Diffractometer*

Abstract

AbstractA single-crystal high-temperature X-ray camera has been built with permissible operating temperatures of 2500°C. The camera is constructed to rest upon a Siemens horizontal diffractometer and may be used with either an external electronic detector or with film. The sample is supported on an externally adjustable goniometer head and is heated from the back by an ion beam. Controlled oscillation allows rotation photographs to be obtained from the sample surface not touched by the ion stream. Temperature is controlled by a thermocouple supporting the sample, the thermocouple being an intrinsic part of the goniometer. As a design limit, zero and first order layer lines with iron Kα. radiation on specimens with lattice parameters of 2.6 Å or larger may be recorded. Copper, cobalt, and molybdenum radiation allow even greater latitude. Types of samples that may be studied include powder (pellet), single crystal, wire, or rod. The camera serves equally well for single-crystal, texture, or powder studies on refractory materials.