Boron nitride as two dimensional dielectric: Reliability and dielectric breakdown-Reference-Cited by-同舟云学术

Boron nitride as two dimensional dielectric: Reliability and dielectric breakdown

Published:2016-01-04 Issue:1 Volume:108 Page:012905
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Ji Yanfeng¹,Pan Chengbin¹^ORCID,Zhang Meiyun²,Long Shibing²,Lian Xiaojuan³,Miao Feng³^ORCID,Hui Fei¹,Shi Yuanyuan¹,Larcher Luca⁴,Wu Ernest⁵,Lanza Mario¹^ORCID

Affiliation:

1. Institute of Functional Nano and Soft Materials, Collaborative Innovation Center of Suzhou Nano Science and Technology, Soochow University, 199 Ren-Ai Road, Suzhou 215123, China

2. Key Laboratory of Microelectronics Devices & Integrated Technology, Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China

3. National Laboratory of Solid State Microstructures, School of Physics, Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing 210093, China

4. DISMI, Università di Modena e Reggio Emilia, 42122 Reggio Emilia, Italy

5. IBM Research Division, Essex Junction, Vermont 05452, USA

Funder

Major State Basic Research Development Program of China

Priority Academic Program Development of Jiangsu Higher Education Institutions

Young 1000 Talent Program of China

Young 973 National Program of the Chinese Ministry of Science and Technology

National Natural Science Foundation of China (NSFC)

National Nanotechnology Center (NANOTEC)

Publisher

AIP Publishing

Subject