Investigation of the defect structure of thin single‐crystalline CoSi2(B) films on Si(111) by transmission electron microscopy
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.352966
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1. Study of ballistic transport in Si‐CoSi2‐Si metal base transistors
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3. Operation of the Si/CoSi2/Si heterostructure transistor
4. Single Crystalline Silicide Formation
5. Growth of single‐crystal CoSi2on Si(111)
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