Electrical and structural degradation of GaN high electron mobility transistors under high-power and high-temperature Direct Current stress
Author:
Affiliation:
1. Microsystems Technology Laboratories, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA
2. IBM T. J. Watson, Yorktown Height, New York 10598, USA
Funder
Office of Naval Research (ONR)
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4905677
Reference37 articles.
1. Reliability issues of GaN based high voltage power devices
2. Reliability of GaN HEMTs: current status and future technology
3. Reliability of GaN High-Electron-Mobility Transistors: State of the Art and Perspectives
4. AlGaN/GaN-Based HEMTs Failure Physics and Reliability: Mechanisms Affecting Gate Edge and Schottky Junction
5. GaN HEMT reliability
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