Application of x‐ray reflectometry in study of nonideal Si/Si1−x‐Gexsuperlattices
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.352185
Reference9 articles.
1. Silicon-based semiconductor heterostructures: column IV bandgap engineering
2. Double‐crystal x‐ray diffraction from Si1−xGex/Si superlattices: Quantification of peak broadening effects
3. Determination Of Thickness Errors And Boundary Roughness From The Measured Performance Of A Multilayer Coating
4. Characterisation of Interfaces in SiGe Superlatrlces by Combined Grazing Incidence X-Ray Fluorescence and Reflectivity
5. Strain relaxation and interdiffusion in Si/Si1−xGex strained layer superlattices
Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. X-ray reflectometry and x-ray fluorescence monitoring of the atomic layer deposition process for high-k gate dielectrics;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;2005
2. Interfaces in Si/Ge atomic layer superlattices on (001)Si: Effect of growth temperature and wafer misorientation;Journal of Applied Physics;1996-08
3. Structural analysis of imperfect GeSi superlattices grown on Ge(001) substrates;Journal of Applied Physics;1995-07
4. Nature and evolution of interfaces in Si/Si1-xGex superlattices;Journal of Electronic Materials;1995-04
5. Structural Parameters of Multilayers from X-ray Reflectivity: an Easy-to-Handle Approach;Journal of Applied Crystallography;1995-04-01
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3