Energy‐resolved DLTS measurement of interface states in MIS structures
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.90650
Reference9 articles.
1. Transient capacitance measurements of hole emission from interface states in MOS structures
2. Evidence for multiphonon emission from interface states in MOS structures
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5. Interface states in SiSiO2 interfaces
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