Time-of-flight mass spectrometry of particle emission during irradiation with slow, highly charged ions-Reference-Cited by-同舟云学术

Time-of-flight mass spectrometry of particle emission during irradiation with slow, highly charged ions

Published:2021-02-01 Issue:2 Volume:92 Page:023909
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Skopinski L.¹^ORCID,Ernst P.¹,Herder M.¹,Kozubek R.¹,Madauß L.¹,Sleziona S.¹,Maas A.¹^ORCID,Königstein N.¹,Lebius H.²^ORCID,Wucher A.¹^ORCID,Schleberger M.¹^ORCID

Affiliation:

1. Fakultät für Physik and CENIDE, Universität Duisburg-Essen, 47057 Duisburg, Germany

2. Normandie Univ., ENSICAEN, UNICAEN, CEA, CNRS, CIMAP, 14000 Caen, France

Funder

Deutsche Forschungsgemeinschaft

Publisher

AIP Publishing

Subject

Instrumentation

Link

https://aip.scitation.org/doi/pdf/10.1063/5.0025812

Reference30 articles.

1. Interaction of slow multicharged ions with solid surfaces

2. Potential sputtering

3. Single ion induced surface nanostructures: a comparison between slow highly charged and swift heavy ions

4. Nanostructures formed on KBr surfaces by the impact of highly charged ions

5. Defect Mediated Desorption of the KBr(001) Surface Induced by Single Highly Charged Ion Impact

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