Polycrystalline Ba0.6Sr0.4TiO3 thin films on r-plane sapphire: Effect of film thickness on strain and dielectric properties
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2374810
Reference23 articles.
1. Integration of>tex<$hbox Ba_xhbox Sr_1-xhbox TiO_3$>/tex<Thin Films With AlGaN/GaN HEMT Circuits
2. Dielectric properties of epitaxial Ba0.5Sr0.5TiO3 films on amorphous SiO2 on sapphire
3. Tunable high-quality-factor interdigitated (Ba, Sr)TiO3 capacitors fabricated on low-cost substrates with copper metallization
4. Pt Hillock Formation and Decay
5. Enhanced tunability of magnetron sputtered Ba0.5Sr0.5TiO3 thin films on c-plane sapphire substrates
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1. Effect of crystal orientation on the segregation of aliovalent dopants at the surface of La0.6Sr0.4CoO3;Journal of Materials Chemistry A;2018
2. Dielectric dynamics of the polycrystalline Ba 0.5 Sr 0.5 TiO 3 thin films;EPL (Europhysics Letters);2016-05-01
3. Effect of oxygen pressure on preferential orientation, microstructure and functional properties of Bi1.5MgNb1.5O7 thin films prepared by pulsed laser deposition;Applied Surface Science;2015-10
4. Combined effects of thickness, grain size and residual stress on the dielectric properties of Ba0.5Sr0.5TiO3 thin films;Journal of Alloys and Compounds;2015-10
5. Domain matched epitaxial growth of (111) Ba0.5Sr0.5TiO3thin films on (0001) Al2O3with ZnO buffer layer;Journal of Applied Physics;2015-03-28
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