Detection of trap activation by ionizing radiation in SiO2 by spatially localized cathodoluminescence spectroscopy
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1512319
Reference31 articles.
1. Depth-dependent spectroscopic defect characterization of the interface between plasma-deposited SiO2 and silicon
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5. Electron spin resonance in glasses
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