Finite-size scaling and exchange-bias in SrRuO3/LaNiO3/SrRuO3 trilayers-Reference-Cited by-同舟云学术

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Finite-size scaling and exchange-bias in SrRuO3/LaNiO3/SrRuO3 trilayers

Published:2017-09-28 Issue:12 Volume:122 Page:124304
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Thota S.¹,Ghosh S.¹,Nayak S.¹,Joshi D. C.¹^ORCID,Pramanik P.¹,Roychowdhury K.²,Das S.³

Affiliation:

1. Department of Physics, Indian Institute of Technology, Guwahati 781039, India

2. LASSP, Department of Physics, Cornell University, Ithaca, New York 14853, USA

3. Department of Materials Science and Engineering, University of California, Berkeley, California 94720, USA

Funder

FIST-DST India

Science and Engineering Research Board (SERB)

Board of Research in Nuclear Sciences (BRNS)

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5004130

Reference66 articles.

1. Structure, physical properties, and applications ofSrRuO3thin films

2. Structure and electrical properties of epitaxial SrRuO3 thin films controlled by oxygen partial pressure

3. Structural, electrical, and magnetic properties of SrRuO3 thin films

4. Feasibility Study of ${\rm SrRuO}_{3}/{\rm SrTiO}_{3}/{\rm SrRuO}_{3}$ Thin Film Capacitors in DRAM Applications

5. Growth of Conductive SrRuO3 Films by Combining Atomic Layer Deposited SrO and Chemical Vapor Deposited RuO2 Layers

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4. Interfacial effect and strain on the electrical and magnetic properties of SrRuO3/NdNiO3 bilayers with 3D island surface layer;Applied Physics A;2022-11-28

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