Porous SiC electroluminescence from p–i–n junction and a lateral carrier diffusion model
Author:
Affiliation:
1. Department of Engineering Physics, McMaster University, 1280 Main Street West, Hamilton, Ontario L8S 4L7, Canada
2. Department of Materials Science and Engineering, McMaster University, 1280 Main Street West, Hamilton, Ontario L8S 4L7, Canada
Funder
Natural Sciences and Engineering Research Council of Canada
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/5.0033243
Reference27 articles.
1. Silicon carbide light-emitting diode as a prospective room temperature source for single photons
2. Photoluminescence and transport studies of boron in 4H SiC
3. Emission of blue light from hydrogenated amorphous silicon carbide
4. Effective optimization of surface passivation on porous silicon carbide using atomic layer deposited Al2O3
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2. Effects of surface roughness and single Shockley stacking fault expansion on the electroluminescence of 4H-SiC;Optics Continuum;2023-04-24
3. Effect of Microindentation on Electroluminescence of SiC P-I-N Junctions;Materials;2022-01-11
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