Characterization of multiple Si∕SiO2 interfaces in silicon-on-insulator materials via second-harmonic generation
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1807011
Reference9 articles.
1. Time-dependent second-harmonic generation from the Si–SiO_2 interface induced by charge transfer
2. Characterization of semiconductor interfaces by second-harmonic generation
3. Coupled Electron-Hole Dynamics at theSi/SiO2Interface
4. Electron Photoinjection from Silicon to Ultrathin SiO2Films via Ambient Oxygen
5. Laser detection of radiation enhanced electron transport in ultra-thin oxides
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