High bandwidth deflection readout for atomic force microscopes
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Published:2015-10
Issue:10
Volume:86
Page:103701
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ISSN:0034-6748
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Container-title:Review of Scientific Instruments
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language:en
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Short-container-title:Review of Scientific Instruments
Author:
Steininger Juergen,
Bibl Matthias,
Yoo Han WoongORCID,
Schitter Georg
Cited by
2 articles.
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