Author:
Ito Shingo,Neyer Daniel,Steininger Juergen,Schitter Georg
Subject
Control and Systems Engineering
Reference27 articles.
1. High-speed atomic force microscopy coming of age;Ando;Nanotechnology,2012
2. Atomic force microscope;Binnig;Phys. Rev. Lett.,1986
3. Review on piezoelectric, ultrasonic, and magnetoelectric actuators;DONG;Journal of Advanced Dielectrics,2012
4. Atomic Force Microscopy;Eaton,2010
5. Dual-stage vertical feedback for high-speed scanning probe microscopy;Fleming;IEEE Transactions on Control Systems Technology,2011
Cited by
12 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献