Wavelength‐modulated photocapacitance spectroscopy
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.327762
Reference13 articles.
1. Bulk and interface imperfections in semiconductors
2. Deep Level Impurities in Semiconductors
3. Capacitance Transient Spectroscopy
4. Deep‐level transient spectroscopy: A new method to characterize traps in semiconductors
5. Derivative surface photovoltage spectroscopy; a new approach to the study of absorption in semiconductors: GaAs
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2. Excitation photocapacitance study of EL2 in n-GaAs prepared by annealing under different arsenic vapor pressures;Journal of Applied Physics;2005-02
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