Wide range local resistance imaging on fragile materials by conducting probe atomic force microscopy in intermittent contact mode-Reference-Cited by-同舟云学术

Wide range local resistance imaging on fragile materials by conducting probe atomic force microscopy in intermittent contact mode

Published:2016-06-13 Issue:24 Volume:108 Page:243101
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Vecchiola Aymeric¹²³,Chrétien Pascal¹,Delprat Sophie³⁴,Bouzehouane Karim³,Schneegans Olivier¹,Seneor Pierre³,Mattana Richard³,Tatay Sergio⁵^ORCID,Geffroy Bernard⁶⁷^ORCID,Bonnassieux Yvan⁶,Mencaraglia Denis¹,Houzé Frédéric¹

Affiliation:

1. Laboratoire de Génie électrique et électronique de Paris (GeePs), UMR 8507 CNRS-CentraleSupélec, Paris-Sud and UPMC Universities, 11 rue Joliot-Curie, Plateau de Moulon, 91192 Gif-sur-Yvette, France

2. Concept Scientific Instruments, ZA de Courtaboeuf, 2 rue de la Terre de Feu, 91940 Les Ulis, France

3. Unité Mixte de Physique CNRS-Thales UMR 137, 1 avenue Augustin Fresnel, 91767 Palaiseau, France

4. UPMC, Université Paris 06, 4 place Jussieu, 75005 Paris, France

5. Molecular Science Institute, University of Valencia, 46980 Paterna, Spain

6. Lab. Physique des Interfaces et Couches minces (PICM), UMR 7647 CNRS-École polytechnique, 91128 Palaiseau, France

7. Lab. d'Innovation en Chimie des Surfaces et Nanosciences (LICSEN), NIMBE UMR 3685 CNRS-CEA Saclay, 91191 Gif-sur-Yvette, France

Funder

Association Nationale de la Recherche et de la Technologie (ANRT)

Agence Nationale de la Recherche (ANR)

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4953870

Reference20 articles.

1. Imaging the local electrical properties of metal surfaces by atomic force microscopy with conducting probes

2. O. Schneegans , Ph.D. thesis, Pierre et Marie Curie University, 1998.

3. P. De Wolf , Ph.D. thesis, University of Leuven, 1998.

4. Improving the electrical performance of a conductive atomic force microscope with a logarithmic current-to-voltage converter

5. Mapping of Local Conductivity Variations on Fragile Nanopillar Arrays by Scanning Conductive Torsion Mode Microscopy

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