Nondestructive determination of layers producing Franz-Keldysh oscillations appearing in photoreflectance spectra of heterojunction bipolar transistor structures based on their line-shape analysis-Reference-Cited by-同舟云学术

Nondestructive determination of layers producing Franz-Keldysh oscillations appearing in photoreflectance spectra of heterojunction bipolar transistor structures based on their line-shape analysis

Published:2004-08-15 Issue:4 Volume:96 Page:1967-1974
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Takeuchi Hideo,Yamamoto Yoshitsugu,Nakayama Masaaki

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1766416

Reference34 articles.

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4. Contactless electromodulation for the nondestructive, room-temperature analysis of wafer-sized semiconductor device structures

5. F. H. Pollak, W. Krystek, M. Leibovitch, H. Qiang, D. C. Streit, and M. Wojtowicz, in Proceedings of Internation Workshop on Semiconductor Characterization: Presents and Future Needs, edited by W. M. Bullis, D. G. Seiler, and A. C. Diebold (American Institute of Physics, Woodbury, NY, 1996), pp. 669–672.

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