A comparative study of the electrical properties of Pd/ZnO Schottky contacts fabricated using electron beam deposition and resistive/thermal evaporation techniques-Reference-Cited by-同舟云学术

A comparative study of the electrical properties of Pd/ZnO Schottky contacts fabricated using electron beam deposition and resistive/thermal evaporation techniques

Published:2011-11 Issue:9 Volume:110 Page:094504
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Mtangi W.,Auret F. D.,Janse van Rensburg P. J.,Coelho S. M. M.,Legodi M. J.,Nel J. M.,Meyer W. E.,Chawanda A.

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.3658027

Reference22 articles.

1. A method to correct for leakage current effects in deep level transient spectroscopy measurements on Schottky diodes

2. Characterization of hydrophobic bonded silicon wafers

3. Resolution of the a-Si:H DLTS energy scale controversy

4. Electrical and hydrogen sensing characteristics of Pd/ZnO Schottky diodes grown on GaAs

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