Microstructural evolution of sputtered ZnO thin films with rapid thermal annealing-Reference-Cited by-同舟云学术

Microstructural evolution of sputtered ZnO thin films with rapid thermal annealing

Published:2015-07-23 Issue:10 Volume:26 Page:7860-7866
ISSN:0957-4522
Container-title:Journal of Materials Science: Materials in Electronics
language:en
Short-container-title:J Mater Sci: Mater Electron

Author:

Ghosh S. P.,Das K. C.,Tripathy N.,Bose G.,Kim D. H.,Lee T. I.,Myoung J. M.,Kar J. P.

Funder

Department of Science and Technology (DST), India sponsored Indo-Korea project

DST Science and Engineering Research Board (SERB) project under Fast Track Scheme for Young Scientist

International Research & Development Program of the National Research Foundation of Korea (NRF) funded by the Ministry of Science, ICT & Future Planning

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1007/s10854-015-3436-y.pdf

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