Interfacial reactions between WNx and poly Si1−xGex films
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1622779
Reference16 articles.
1. Thermal stability of CoSi/sub 2/ film for CMOS salicide
2. A nitride-isolated molybdenum-polysilicon gate electrode for MOS VLSI circuits
3. Effect of selective tungsten as a polysilicon shunt on CMOS ring-oscillator performance
4. New method to improve thermal stability in the interface of silicon and tungsten by the interposition of plasma deposited tungsten nitride thin film
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Formation and Nonvolatile Memory Application of Ge Nanocrystals by Using Internal Competition Reaction of $\hbox{Si}_{{\bf 1.33}} \hbox{Ge}_{{\bf 0.67}} \hbox{O}_{\bf 2}$ and $\hbox{Si}_{{\bf 2.67}} \hbox{Ge}_{{\bf 1.33}} \hbox{N}_{\bf 2}$ Layers;IEEE Transactions on Nanotechnology;2009-03
2. Numerical simulation of Si 1– x Ge x /HfO 2 /Si MOS devices;physica status solidi (c);2005-05
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