High conductivity in Ge-doped AlN achieved by a non-equilibrium process

Author:

Bagheri Pegah1ORCID,Quiñones-Garcia Cristyan1ORCID,Khachariya Dolar2ORCID,Loveless James1ORCID,Guan Yan1,Rathkanthiwar Shashwat1ORCID,Reddy Pramod2ORCID,Kirste Ronny2ORCID,Mita Seiji2,Tweedie James2,Collazo Ramón1ORCID,Sitar Zlatko12ORCID

Affiliation:

1. Department of Materials Science and Engineering, North Carolina State University 1 , Raleigh, North Carolina 27695, USA

2. Adroit Materials 2 , Cary, North Carolina 27518, USA

Abstract

Highly conductive Ge-doped AlN with conductivity of 0.3 (Ω cm)−1 and electron concentration of 2 × 1018 cm−3 was realized via a non-equilibrium process comprising ion implantation and annealing at a moderate thermal budget. Similar to a previously demonstrated shallow donor state in Si-implanted AlN, Ge implantation also showed a shallow donor behavior in AlN with an ionization energy ∼80 meV. Ge showed a 3× higher conductivity than its Si counterpart for a similar doping level. Photoluminescence spectroscopy indicated that higher conductivity for Ge-doped AlN was achieved primarily due to lower compensation. This is the highest n-type conductivity reported for AlN doped with Ge to date and demonstration of technologically useful conductivity in Ge-doped AlN.

Funder

Air Force Office of Scientific Research

Advanced Research Projects Agency - Energy

National Science Foundation

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

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