Enhanced conduction and minimized charge trapping in electrically alterable read‐only memories using off‐stoichiometric silicon dioxide films
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.333291
Reference26 articles.
1. Extended cyclability in electrically-alterable read-only-memories
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5. Study of charge trapping as a degradation mechanism in electrically alterable read‐only memories
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