Schwoebel-Ehrlich barrier: from two to three dimensions
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1475774
Reference27 articles.
1. Effect of texture and grain structure on electromigration in Al-0.5%Cu thin films
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3. Al‐Si crystallographic‐orientation transition in Al‐Si/TiN layered structures and electromigration performance as interconnects
4. Step Motion on Crystal Surfaces
5. Atomic View of Surface Self‐Diffusion: Tungsten on Tungsten
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